top of page

Journal 2021

ACDC

A dynamic calibration method for injection-dependent charge carrier lifetime measurements

Small Methods, 2021

Y. Zhu, T. Trupke, Z. Hameiri

​

ACDC

Review of injection dependent charge carrier lifetime spectroscopy

Progress in Energy, 2021

Y. Zhu, Z. Hameiri

​

Joint

Impurity gettering by silicon nitride films: Kinetics, mechanisms and simulation

ACS Applied Energy Materials, 2021

T. Le, Z. Hameiri, T. Truong, Z. Yang, D. MacDonald, A. Liu

​

Joint

Enhanced hole-carrier selectivity in wide bandgap halide perovskite photovoltaic devices for indoor internet of things applications

Advanced Functional Materials, 2021

M. Lee, E. Choi, A.M. Soufiani, J. Lim, M. Kim, D. Chen, M.A. Green, J. Seidel, S. Lim, J. Kim, X. Dai, R.L. Chin, B. Zheng, Z. Hameiri, J. Park, X. Hao, and J.S. Yun

​

Joint

Identification of embedded nanotwins at c-Si/a-Si:H interface limiting the performance of high-efficiency silicon heterojunction solar cells

Nature Energy, 2021

X. Qu, Y. He, M. Qu, T. Ruan, F. Chu, Z. Zheng, Y. Ma, Y. Chen, X. Ru, X. Xu, H. Yan, L. Wang, Y. Zhang, X. Hao, Z. Hameiri, Z.G. Chen, L. Wang, K. Zheng

​

Joint

Photoconductance determination of carrier capture cross sections of slow traps in silicon through variable pulse filling

IEEE Journal of Photovoltaics, 2021

M. Siriwardhana, Y. Zhu, Z. Hameiri, D. Macdonald, F. Rougieux

​

Joint

Investigation of the selectivity-mechanism of copper (I) sulfide (Cu2S) as a dopant-free carrier selective contact for silicon solar cells

Applied Surface Science, 2021

Z. Sun, C. Yi, Z. Hameiri, S. Bremner

​

Joint

The role of charge and recombination-enhanced-defect-reaction effects in the dissociation of FeB pairs in p-type silicon under injection

Physica Status Solidi - Rapid Research Letters, 2021

C. Sun, Y. Zhu, M. Juhl, W. Yang, F. Rougieux, Z. Hameiri, D. Macdonald

​

Joint

Selective current injected electroluminescence imaging for series resistance feature identification

Solar RRL, 2021

Y. Wang, R.L. Chin, A. Paduthol, W. Zhai, X. Hao, T. Trupke, Z.Hameiri

​

bottom of page