top of page
Conference 2016



ACDC
On the limitation of the refractive index at 633 nm to characterize silicon nitride films
3rd International Conference on Emerging Electronics, 2016
Z. Hameiri, N. Borojevic, L. Mai, N. Nandakumar, K. Kim, S. Winderbaum



ACDC
Defect characterization via temperature and injection dependent lifetime spectroscopy
9th International Workshop on Crystalline Silicon for Solar Cells and the 3rd Silicon Materials Workshop, 2016
Y. Zhu, C.Vargas, M.A. Jensen, M.K. Juhl, G. Coletti, Z. Hameiri
bottom of page