ACDC

Investigation of low injection effects using the local ideality factor obtained from effective lifetime measurements

40th IEEE Photovoltaic Specialists Conference, 2014

Z. Hameiri, F.J. Ma, K. McIntosh

ACDC

Numerical analysis of injection level dependent effective lifetime on 125 mm undiffused lifetime samples

40th IEEE Photovoltaic Specialists Conference, 2014

F.J. Ma, Z. Hameiri, G.S. Samudra, M. Peters, B. Hoex

Joint

SunsPZ©: Real-time spatially resolved solar cell parameter visualizer

40th IEEE Photovoltaic Specialists Conference, 2014

P. Chaturvedi, Z. Hameiri, B. Hoax

Joint

Dielectric charge tailoring in PECVD SiOx/SiNx stacks and its impact on industrial p-type Si wafer solar cell efficiency

40th IEEE Photovoltaic Specialists Conference, 2014

S. Duttagupta, Z. Hameiri, B. Hoex, A.G. Aberle

Joint

Stored charge properties of anodic aluminium oxide on silicon substrate

40th IEEE Photovoltaic Specialists Conference, 2014

Z. Lu, P.H. Lu, Z. Hameiri, K. Wang, J. Cui, Y. Li, A. Lennon

Joint

Numerical analysis of injection level dependent effective lifetime on 125 mm undiffused lifetime samples

40th IEEE Photovoltaic Specialists Conference, 2014

F.J. Ma, Z. Hameiri, G.S. Samudra, M. Peters, B. Hoex

Joint

Application of non-contact corona-Kelvin metrology for characterization of PV dielectrics on textured surfaces

40th IEEE Photovoltaic Specialists Conference, 2014

M. Wilson, Z. Hameiri, N. Nandakumar, S. Duttagupta

ACDC

Lifetime spectroscopy from temperature-dependent photoluminescence imaging

6th World Conference on Photovoltaic Energy Conversion, 2014

Z. Hameiri, M.K Juhl, T. Trupke

ACDC

Spatially resolved lifetime spectroscopy from temperature-dependent photoluminescence imaging

6th World Conference on Photovoltaic Energy Conversion, 2014

Z. Hameiri, M.K Juhl, T. Trupke

ACDC

Automated method for determination bulk doping density from simultaneous photoconductance and photoluminescence measurements

6th World Conference on Photovoltaic Energy Conversion, 2014

M.K Juhl, Z. Hameiri, T. Trupke