Conference 2014



ACDC
Investigation of low injection effects using the local ideality factor obtained from effective lifetime measurements
40th IEEE Photovoltaic Specialists Conference, 2014
Z. Hameiri, F.J. Ma, K. McIntosh



ACDC
Numerical analysis of injection level dependent effective lifetime on 125 mm undiffused lifetime samples
40th IEEE Photovoltaic Specialists Conference, 2014
F.J. Ma, Z. Hameiri, G.S. Samudra, M. Peters, B. Hoex



Joint
SunsPZĀ©: Real-time spatially resolved solar cell parameter visualizer
40th IEEE Photovoltaic Specialists Conference, 2014
P. Chaturvedi, Z. Hameiri, B. Hoax



Joint
Dielectric charge tailoring in PECVD SiOx/SiNx stacks and its impact on industrial p-type Si wafer solar cell efficiency
40th IEEE Photovoltaic Specialists Conference, 2014
S. Duttagupta, Z. Hameiri, B. Hoex, A.G. Aberle



Joint
Stored charge properties of anodic aluminium oxide on silicon substrate
40th IEEE Photovoltaic Specialists Conference, 2014
Z. Lu, P.H. Lu, Z. Hameiri, K. Wang, J. Cui, Y. Li, A. Lennon



Joint
Numerical analysis of injection level dependent effective lifetime on 125 mm undiffused lifetime samples
40th IEEE Photovoltaic Specialists Conference, 2014
F.J. Ma, Z. Hameiri, G.S. Samudra, M. Peters, B. Hoex



Joint
Application of non-contact corona-Kelvin metrology for characterization of PV dielectrics on textured surfaces
40th IEEE Photovoltaic Specialists Conference, 2014
M. Wilson, Z. Hameiri, N. Nandakumar, S. Duttagupta



ACDC
Lifetime spectroscopy from temperature-dependent photoluminescence imaging
6th World Conference on Photovoltaic Energy Conversion, 2014
Z. Hameiri, M.K Juhl, T. Trupke



ACDC
Spatially resolved lifetime spectroscopy from temperature-dependent photoluminescence imaging
6th World Conference on Photovoltaic Energy Conversion, 2014
Z. Hameiri, M.K Juhl, T. Trupke



ACDC
Automated method for determination bulk doping density from simultaneous photoconductance and photoluminescence measurements
6th World Conference on Photovoltaic Energy Conversion, 2014
M.K Juhl, Z. Hameiri, T. Trupke