Conference 2013

Joint

Comparison between PC and PL measurements: A versatile characterisation method for silicon wafers

23rd International Photovoltaic Science and Engineering Conference, 2013

Z. Hameiri, K.K. Gopalan

Joint

Investigation of wet-chemical surface conditioning of crystalline silicon wafers for solar cell applications

23rd International Photovoltaic Science and Engineering Conference, 2013

M. Tang, Z. Hameiri, M. Boreland, A.G. Aberle, T. Mueller

n/a

Joint

Inter-laboratory study of eddy-current measurement of excess-carrier recombination lifetime

39th IEEE Photovoltaic Specialists Conference, 2013

A.L. Blum, J.S. Swirhun, R.A. Sinton, F. Yan, S. Herasimenka, T. Roth, K. Lauer, J. Haunschild, B. Lim, K. Bothe, Z. Hameiri, B. Seipel, R. Xiong, M. Dhamrin, J.D. Murphy

Joint

On the use of local ideality factor obtained from effective carrier lifetime measurements

39th IEEE Photovoltaic Specialists Conference, 2013

Z. Hameiri, K. McIntosh

Joint

Spatially resolved emitter saturation current by photoluminescence imaging

39th IEEE Photovoltaic Specialists Conference, 2013

Z. Hameiri, P. Chaturvedi, M.K. Juhl, T. Trupke

Best Poster Award

Joint

Over 700 mV implied Voc on p-type CZ silicon solar cells with double-sided laser doping

Energy Procedia, 2013

G. Xu, B. Hallam, Z. Hameiri, C. Chan, Y. Yao, C. Chong, S.R. Wenham