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Conference 2013



Joint
Comparison between PC and PL measurements: A versatile characterisation method for silicon wafers
23rd International Photovoltaic Science and Engineering Conference, 2013
Z. Hameiri, K.K. Gopalan



Joint
Investigation of wet-chemical surface conditioning of crystalline silicon wafers for solar cell applications
23rd International Photovoltaic Science and Engineering Conference, 2013
M. Tang, Z. Hameiri, M. Boreland, A.G. Aberle, T. Mueller
n/a



Joint
Inter-laboratory study of eddy-current measurement of excess-carrier recombination lifetime
39th IEEE Photovoltaic Specialists Conference, 2013
A.L. Blum, J.S. Swirhun, R.A. Sinton, F. Yan, S. Herasimenka, T. Roth, K. Lauer, J. Haunschild, B. Lim, K. Bothe, Z. Hameiri, B. Seipel, R. Xiong, M. Dhamrin, J.D. Murphy



Joint
Spatially resolved emitter saturation current by photoluminescence imaging
39th IEEE Photovoltaic Specialists Conference, 2013
Z. Hameiri, P. Chaturvedi, M.K. Juhl, T. Trupke
Won - Best Poster Award



Joint
On the use of local ideality factor obtained from effective carrier lifetime measurements
39th IEEE Photovoltaic Specialists Conference, 2013
Z. Hameiri, K. McIntosh



Joint
Over 700 mV implied Voc on p-type CZ silicon solar cells with double-sided laser doping
Energy Procedia, 2013
G. Xu, B. Hallam, Z. Hameiri, C. Chan, Y. Yao, C. Chong, S.R. Wenham
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