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Investigation of defects and interfaces in silicon wafers

Journal - Joint

Hydrogenation in multicrystalline silicon: The impact of dielectric film properties and firing conditions

Progress in Photovoltaics: Research and Applications, 2020

H.C. Sio, S.P. Phang, H.T. Nguyen, Z. Hameiri, D. Macdonald

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Journal - ACDC

Degradation of surface passivation and bulk in p-type monocrystalline silicon wafers at elevated temperature

IEEE Journal of Photovoltaics, 2019

K. Kim, R. Chen, D. Chen, P. Hamer, A. Ciesla (nee Wenham), S. Wenham, Z. Hameiri

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Journal - ACDC

Degradation and recovery of n-type multi-crystalline silicon under illuminated and dark annealing conditions at moderate temperatures

IEEE Journal of Photovoltaics, 2019

C. Vargas, S. Nie, D. Chen, C. Chan, B. Hallam, G. Coletti, Z. Hameiri

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Journal - ACDC

On the impact of dark annealing and room temperature illumination on p-type multicrystalline silicon wafers

Solar Energy Materials and Solar Cells, 2019

C. Vargas, G. Coletti, C. Chan, D. Payne, Z. Hameiri

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Journal - ACDC

Reassessments of minority carrier traps in silicon with photoconductance decay measurements

IEEE Journal of Photovoltaics, 2019

Y. Zhu, M.K. Juhl, G. Coletti, Z. Hameiri

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Erratum

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Journal - Joint

Degradation and regeneration of radiation-induced defects in silicon: A study of vacancy-hydrogen interactions

Solar Energy Materials and Solar Cells, 2019

M.U. Khan, D. Chen, S. Jafari, T. Ohshima, H. Abe, Z. Hameiri, C.M. Chong, M. Abbott,

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Journal - Joint

Gettering effects of silicon nitride films from various plasma-enhanced chemical vapour deposition condition

IEEE Journal of Photovoltaics, 2019

A.Y Liu, Z. Hameiri, Y. Wan, C. Sun, D. Macdonald

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Journal - ACDC

Carrier-induced degradation in multicrystalline silicon: Dependence on the silicon nitride passivation layer and hydrogen released during firing

IEEE Journal of Photovoltaics, 2018

C. Vargas, K. Kim, G. Coletti, D. Payne, C. Chan, S. Wenham, Z. Hameiri

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Journal - Joint

Impact of dark annealing on the kinetics of light- and elevated temperature-induced degradation

IEEE Journal of Photovoltaics, 2018

S. Liu, D. Payne, C. Vargas, D. Chen, M. Kim, C. Sen, U. Varshney, Z. Hameiri, C. Chan, M. Abbott, S. Wenham

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Journal - ACDC

The impact of surface damage region and edge recombination on the effective lifetime of silicon wafers at low illumination conditions

Journal of Applied Physics, 2015

Z. Hameiri, F.J. Ma

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