TNO
Collaborations



Journal - ACDC
Erratum to “Reassessments of minority carrier traps in silicon with photoconductance decay measurements”
IEEE Journal of Photovoltaics, 2021
Y. Zhu, M.K. Juhl, G. Coletti, Z. Hameiri



Journal - ACDC
Electrical characterization of thermally activated defects in n-type float-zone silicon
IEEE Journal of Photovoltaics, 2021
Y. Zhu, F. Rougieux, N.E. Grant, J.A.T. De Guzman, J.D. Murphy, V.P. Markevich, G.Coletti, A.R. Peaker, Z. Hameiri



Journal - ACDC
Investigation of two-level defects in injection dependent lifetime spectroscopy
Solar Energy Materials and Solar Cells, 2020
Y. Zhu, C. Sun, T. Niewelt, G. Coletti, Z. Hameiri



Journal - ACDC
Degradation and recovery of n-type multi-crystalline silicon under illuminated and dark annealing conditions at moderate temperatures
IEEE Journal of Photovoltaics, 2019
C. Vargas, S. Nie, D. Chen, C. Chan, B. Hallam, G. Coletti, Z. Hameiri



Journal - ACDC
On the impact of dark annealing and room temperature illumination on p-type multicrystalline silicon wafers
Solar Energy Materials and Solar Cells, 2019
C. Vargas, G. Coletti, C. Chan, D. Payne, Z. Hameiri



Journal - ACDC
Carrier-induced degradation in multicrystalline silicon: Dependence on the silicon nitride passivation layer and hydrogen released during firing
IEEE Journal of Photovoltaics, 2018
C. Vargas, K. Kim, G. Coletti, D. Payne, C. Chan, S. Wenham, Z. Hameiri



Journal - ACDC
On the transient negative photoconductance in n-type Czochralski silicon
IEEE Journal of Photovoltaics, 2018
Y. Zhu, M.K. Juhl, G. Coletti, Z. Hameiri



Journal - ACDC
Recombination parameters of lifetime-limiting carrier-induced defects in multicrystalline silicon for solar cells
Applied Physics Letters, 2017
C. Vargas, Y. Zhu, G. Coletti, C. Chan, D. Payne, M. Jensen, Z. Hameiri



Journal - ACDC
Application of the Newton–Raphson method to lifetime spectroscopy for extraction of defect parameters
IEEE Journal of Photovoltaics, 2017
Y. Zhu, Q.T. Gia, M.K. Juhl, G. Coletti, Z. Hameiri