Journal - ACDC

Erratum to “Reassessments of minority carrier traps in silicon with photoconductance decay measurements”

IEEE Journal of Photovoltaics, 2021

Y. Zhu, M.K. Juhl, G. Coletti, Z. Hameiri

Journal - ACDC

Electrical characterization of thermally activated defects in n-type float-zone silicon

IEEE Journal of Photovoltaics, 2021

Y. Zhu, F. Rougieux, N.E. Grant, J.A.T. De Guzman, J.D. Murphy, V.P. Markevich, G.Coletti, A.R. Peaker, Z. Hameiri

Journal - ACDC

Investigation of two-level defects in injection dependent lifetime spectroscopy

Solar Energy Materials and Solar Cells, 2020

Y. Zhu, C. Sun, T. Niewelt, G. Coletti, Z. Hameiri

Journal - ACDC

Degradation and recovery of n-type multi-crystalline silicon under illuminated and dark annealing conditions at moderate temperatures

IEEE Journal of Photovoltaics, 2019

C. Vargas, S. Nie, D. Chen, C. Chan, B. Hallam, G. Coletti, Z. Hameiri

Journal - ACDC

On the impact of dark annealing and room temperature illumination on p-type multicrystalline silicon wafers

Solar Energy Materials and Solar Cells, 2019

C. Vargas, G. Coletti, C. Chan, D. Payne, Z. Hameiri

Journal - ACDC

Reassessments of minority carrier traps in silicon with photoconductance decay measurements

IEEE Journal of Photovoltaics, 2019

Y. Zhu, M.K. Juhl, G. Coletti, Z. Hameiri

Journal - ACDC

Carrier-induced degradation in multicrystalline silicon: Dependence on the silicon nitride passivation layer and hydrogen released during firing

IEEE Journal of Photovoltaics, 2018

C. Vargas, K. Kim, G. Coletti, D. Payne, C. Chan, S. Wenham, Z. Hameiri

Journal - ACDC

On the transient negative photoconductance in n-type Czochralski silicon

IEEE Journal of Photovoltaics, 2018

Y. Zhu, M.K. Juhl, G. Coletti, Z. Hameiri

Journal - ACDC

Recombination parameters of lifetime-limiting carrier-induced defects in multicrystalline silicon for solar cells

Applied Physics Letters, 2017

C. Vargas, Y. Zhu, G. Coletti, C. Chan, D. Payne, M. Jensen, Z. Hameiri

Journal - ACDC

Application of the Newton–Raphson method to lifetime spectroscopy for extraction of defect parameters

IEEE Journal of Photovoltaics, 2017

Y. Zhu, Q.T. Gia, M.K. Juhl, G. Coletti, Z. Hameiri