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A dynamic calibration method for injection-dependent charge carrier lifetime measurements
A dynamic calibration method for injection-dependent charge carrier lifetime measurements
A dynamic calibration method for injection-dependent charge carrier lifetime measurements
National University of Singapore
Collaborations
Conference - ACDC
On the limitation of the refractive index at 633 nm to characterize silicon nitride films
3rd International Conference on Emerging Electronics, 2016
Z. Hameiri, N. Borojevic, L. Mai, N. Nandakumar, K. Kim, S. Winderbaum
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