University of Manchester Collaborations

Electrical characterization of thermally activated defects in n-type float-zone silicon

IEEE Journal of Photovoltaics, 2021

Y. Zhu, F. Rougieux, N.E. Grant, J.A.T. De Guzman, J.D. Murphy, V.P. Markevich, G.Coletti, A.R. Peaker, Z. Hameiri

On the correlation between light-induced degradation and minority carrier traps in boron-doped czochralski silicon

ACS Applied Materials & Interfaces, 2021

S. Jafari, Y. Zhu, F. Rougieux, J. A. T. De Guzman, V. P. Markevich, A. R. Peaker, Z. Hameiri

New insights into the thermally activated defects in n-type float-zone silicon

9th SiliconPV, 2019

Y. Zhu, F. Rougieux, N. Grant, J. Mullins, J.A. De Guzman, J. Murphy, V. Markevich, G. Coletti, A. Peaker, Z. Hameiri

Boron-oxygen related light-induced degradation of Si solar cells: Transformation between minority carrier trapping and recombination active centers

47th IEEE Photovoltaics Specialists Conference, 2020

S. Jafari, Y. Zhu, F. Rougieux, J.A.T De Guzman, V.P. Markevich, A.R. Peaker, Z. Hameiri

Boron-oxygen-related traps in Czochralski grown silicon

Asia-Pacific Solar Research Conference, 2020

S. Jafari, Y. Zhu, F. Rougieux, J.A.T. De Guzman, V.P. Markevich, A.R. Peaker, Z. Hameiri