University of Manchester Collaborations
Journal Papers
Electrical characterization of thermally activated defects in n-type float-zone silicon
IEEE Journal of Photovoltaics, 2021
Y. Zhu, F. Rougieux, N.E. Grant, J.A.T. De Guzman, J.D. Murphy, V.P. Markevich, G.Coletti, A.R. Peaker, Z. Hameiri
On the correlation between light-induced degradation and minority carrier traps in boron-doped Czochralski silicon
ACS Applied Materials & Interfaces, 2021
S. Jafari, Y. Zhu, F. Rougieux, J. A. T. De Guzman, V. P. Markevich, A. R. Peaker, Z. Hameiri
Conference Papers
New insights into the thermally activated defects in n-type float-zone silicon
9th SiliconPV, 2019
Y. Zhu, F. Rougieux, N. Grant, J. Mullins, J.A. De Guzman, J. Murphy, V. Markevich, G. Coletti, A. Peaker, Z. Hameiri
Boron-oxygen related light-induced degradation of Si solar cells: Transformation between minority carrier traps and recombination active centers
47th IEEE Photovoltaics Specialists Conference, 2020
S. Jafari, Y. Zhu, F. Rougieux, J.A.T De Guzman, V.P. Markevich, A.R. Peaker, Z. Hameiri
Boron-oxygen-related traps in Czochralski grown silicon
Asia-Pacific Solar Research Conference, 2020
S. Jafari, Y. Zhu, F. Rougieux, J.A.T. De Guzman, V.P. Markevich, A.R. Peaker, Z. Hameiri